Microstructure characterization of the YBa2Cu3O7-y thin films derived from the metal-naphthenates gels coated on SrTiO3(100) and LaAlO3(100) substrates

X. L. Ma,J. Shibata,K. Yamagiwa,Y. Ikuhara,I. Hirabayashi,T. Hirayama

doi:10.1007/978-4-431-66874-9_258

Microstructure characterization of the YBa2Cu3O7-y thin films derived from the metal-naphthenates gels coated on SrTiO3(100) and LaAlO3(100) substrates

X. L. Ma, J. Shibata + Show 4 more

https://doi.org/10.1007/978-4-431-66874-9_258

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Publication Date: Jan 1, 1999

Affiliation: Japan Fine Ceramics Center, International Superconductivity Technology Center, The University of Tokyo, Tokyo University of Science

#C-axis Film #Cross-sectional High-resolution Electron Microscopy + Show 8 more

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Abstract

The thin films of YBa2Cu3O7-y, prepared by chemical solution deposition on SrTiO3(100) and LaAlO3(100) substrates, have been characterized by cross-sectional high-resolution electron microscopy. It is found that the c-axis Y123 thin films, thickness range from 10nm to 60nm, were epitaxially grown on the substrates and the a-axis island-shaped grains generated from the c-axis film. The derived c-axis and a-axis films are defective with stacking faults to form a defect microstructure rather than forming the well-ordered YBa2Cu4O8(Y124) phase.

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