Abstract
Orthorhombic TmMnO 3 (o-TMO) thin films have been epitaxially stabilized on (110) SrTiO 3 substrates by pulsed laser deposition (PLD) technique. The microstructure and strain relaxation mechanism of o-TMO thin films are analyzed using transmission electron microscopy. It is shown that major defects in the films are misfit dislocations with Burgers vectors of type a p〈010〉 and a p〈110〉, whereas a p〈110〉 dislocations tend to dissociate into partial dislocations with Burgers vectors of type 1/2 a p〈110〉. Strain in o-TMO films is relaxed by misfit dislocations as well as surface fluctuations, which is different from most of the previous studies of the perovskite thin films.
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