Abstract
SiC-W multilayer thin films with various modulation wavelengths were prepared by a magnetron sputtering system. Using low-angle x-ray diffraction (LXD), their interface microstructure and the modulation period were studied. The mechanical properties of these films were investigated using an ultramicrohardness (UMH) tester with loads smaller than 20 mN. It was shown that the UMH values of multilayer films varies with applied load L and modulation wavelength. When L was 5 mN, was 10 nm, the UMH reached a maximum, 19.869 GPa, which was 1.02 times higher than that of the homogeneously mixed film. The anomalous peak effect of UMH varying with the modulation wavelength is discussed.
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