Abstract
The aim of this work was the investigation of the microstructure and properties of layered composites produced with the tape casting technique stacking electrically insulating and conductive layers in the AlN-SiC-MoSi 2 system. The microstructure of the laminated material was investigated by SEM-EDS technique. Macroscopic residual stresses developed in the composite were qualitatively evaluated by Raman piezo-spectroscopy. Flexural strength was determined in 4-pt bending, fracture toughness was evaluated by the SEVNB method. The mechanical properties of the ceramic laminate were compared to those of the stress-free constituent materials in order to understand the effects of the residual stresses. By Raman piezo-spectroscopy, compression was found in the insulating layers and tension in the conductive layers. Thanks to the compressive state of the outer layer, the fracture strength and toughness of the laminated composite were higher than those of the stress-free constituent materials.
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