Abstract
SiO/sub 2/ added CoPtCr magnetic layers are employed for perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains (size /spl sim/7 nm), surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO/sub 2/ to CoPtCr is very effective in realizing a well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on the Ru underlayer. The medium with a 12-nm-thick recording layer shows a large perpendicular anisotropy K/sub u/ of /spl sim/4 /spl times/ 10/sup 6/ erg/cm/sup 3/, and high coercivity H/sub c/ of /spl sim/4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating great potential for high-density perpendicular recording media.
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