Abstract
The directionally solidified Si–TaSi 2 eutectic in situ composites, which have highly aligned and uniformly distributed TaSi 2 fibers embedded in the Si continuous matrix, are obtained by electron beam floating zone melting (EBFZM) technique at the solidification rate range 0.3–9.0 mm/min. The preferential orientation of the Si–TaSi 2 eutectic is also studied by selected area electron diffraction (SAED), which is [0 1¯ 1¯]Si∥[0 0 0 1]TaSi 2 and (0 1¯ 1)Si∥(0 1¯ 1 1)TaSi 2. Moreover, field emission properties of the Si–TaSi 2 eutectic in situ composites are investigated by transparent anode imaging technology. Approximately straight F–N curves show that this material has excellent field emission properties.
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