Microstructural study of titanium–palladium–nickel base thin film shape memory alloys

Abstract

A new generation of thin film shape memory alloys has been developed with 1.65 μm thickness for micro-actuator applications. In this work, the microstructure of thin film Titanium–Palladium–Nickel (TiPdNi) shape memory alloys deposited using ion beam assisted deposition from a Ti 50Pd 30Ni 20 target is studied. The TiPdNi thin films were deposited with and without substrate heating during deposition. As-deposited films without substrate heating were found to be amorphous. Deposition on heated substrate produced a dense, columnar crystalline structure. Microstructures of bulk TiPdNi thin films as well as the interfacial region between the film and substrate were characterized by various techniques including transmission electron microscope, scanning transmission electron microscope, scanning electron microscope-energy dispersive X-ray spectroscopy and scanning transmission electron microscope-energy dispersive X-ray spectroscopy. A transition layer with 70 nm thickness is observed at the interface between the bulk film and silicon substrate. It is composed of three layers; two amorphous layers above the silicon substrate and a 50 nm thick twin absent layer, which was identified as B2 austenite phase by Fourier spectra analysis. In the bulk film, nano-scale grains in the range of 80–200 nm were observed. The width of twin band of the film was very narrower in the range of ∼5 nm.