Abstract
AbstractIn the present study, we fabricate undoped and 1 wt% palladium (Pd)-doped tin oxide (SnO2) films were deposited on alumina substrate using screen-printing technology. The deposited film is characterized, and its microstructural properties are studied using X-ray diffraction (XRD) and atomic force microscope (AFM). XRD measurement reveals that the crystallite size was ~23.5 nm and ~19.2 nm for undoped and Pd-doped SnO2 film, respectively. The morphology analysis shows that grain size and roughness parameter reduce with Pd doping.KeywordsPalladium (Pd)Tin Oxide (SnO2)XRDAFM
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