Abstract
Microstructures of electrodeposited Ni were studied from the perspective of growth modes during electrodeposition. The electrodeposited Ni had a heterogeneous microstructure composed of nanocrystalline- and microcrystalline-grains. Electron backscatter diffraction analyses showed that nanocrystalline- and microcrystalline-grains were preferentially oriented to specific planes. Secondary ion mass spectrometry also revealed that coarse-grained regions had higher S content than that of finer-grained regions. Hence, microstructural heterogeneity in electrodeposited Ni is reflected by the overlap of inhibited and free growth modes. Our discussion surrounding microstructural heterogeneity also provides insight into other electrodeposited nanocrystalline systems.
Highlights
Microstructures of electrodeposited Ni were studied from the perspective of growth modes during electrodeposition
The heterogeneous microstructure was characterized by electron backscatter diffraction (EBSD) and secondary ion mass spectrometry (SIMS) to verify whether the heterogeneous structure was attributed to the growth mode
Electrodeposited Ni with a heterogeneous microstructure composed of nanocrystalline- and microcrystalline-grains was characterized by EBSD and SIMS techniques
Summary
Microstructures of electrodeposited Ni were studied from the perspective of growth modes during electrodeposition. Matsui et al.[12] found a relationship between the tensile elongation and orientation index for the (200) plane in electrodeposited nanocrystalline Ni–W alloys This relationship indicates that the free-lateral growth mode is suitable for producing ductile electrodeposited nanocrystalline materials. In previous studies[12,20,21], the effects of growth modes have been discussed by comparison of typical samples having different dominant orientations. These comparisons are based on the assumption that typical samples are electrodeposited by a single growth mode. The microstructure of electrodeposited samples is uniform, and a heterogeneous grain structure forms from different growth modes. The heterogeneous microstructure was characterized by electron backscatter diffraction (EBSD) and secondary ion mass spectrometry (SIMS) to verify whether the heterogeneous structure was attributed to the growth mode
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