Abstract
Shear localization is one of the most important failure mechanisms subjected to high-strain-rate deformation and has significant effects on the process, plastic deformation, and catastrophic failure of a material. Shear localization was observed in serrated chips produced during the high-speed cutting of the CoCrFeMnNi high-entropy alloy. Electron backscatter diffraction was performed to systematically investigate microstructural evolution during shear banding. The elongation and subdivision of the narrow grains were observed in the areas adjacent to the shear band. The microstructure inside the shear band was found to be composed of equiaxed ultrafine grains. The results reveal that grain subdivision and dynamic recrystallization might have significant roles in the microstructural evolution of shear bands. These results offer key insights into our understanding of shear localization and high-speed machining behavior for high entropy alloys.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
