Abstract
The aim of this work was to verify the stability of the βCo2Si phase in the Co-Si system. The samples were produced via arc-melting and characterized through Scanning Electron Microscopy (SEM) and Differential Thermal Analysis (DTA). The results have confirmed the stability of the βCo2Si phase, however, a modification of the shape of βCo2Si phase field is proposed in order to fully explain the results.
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