Abstract
Transmission electron microscopy was used for characterizing the defect microstructure induced by shock experiments in a single crystal of diopside. The shock-induced defects found in the crystal can be divided in four distinct types: 1) A high density and pervasive distribution of dislocations in glide configuration (glide systems (100)[0 2) Mechanical twin lamellae, mostly parallel to (100), the (001) twin lamellae are less abundant. li]3) 4) Heterogeneously distributed tiny molten zones (3 to 20 μm size) which, after cooling, appear as a glass with a chemical composition very close to the one of the original diopside.
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