Abstract
We investigated the nature of microstructural defects existing inYBCO/DyBCO/YBCO multilayers deposited by pulsed laser deposition onCeO2-buffered sapphire substrates to clarify the origin of magnetic flux pinning enhancementobserved in these films. A relatively thin YBCO film contains high concentrations ofantiphase boundaries (APBs) and short-range stacking faults (SFs) oriented along theab plane. Multilayering thin layers of YBCO with DyBCO results in a similar highly faultedmicrostructure, with APBs and SFs homogeneously distributed throughout thethickness. In addition, multilayers have incorporated elongated defects, parallel to thec-axis direction, emanating from the DyBCO intermediate layer and extending towards thetop YBCO layer. Multilayers have also developed long-range SFs which intersect thec-axis-oriented elongated defects and are mostly concentrated in the region of the DyBCOand the upper YBCO layer, indicating a correlation between the formation of the two typesof defects. The microstructural features of the YBCO/DyBCO/YBCO multilayerscorrelate well with the evaluation of the magnetic field angular dependence ofJc, which revealed a significant enhancement when the field is aligned along theab plane .
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