Microstructural characterization using x-ray diffraction imaging

Abstract

X-ray diffraction imaging, also known as x-ray topography, is a powerful tool to study the defect microstructure of single crystals. As the name implies, this technique is based on recording an image of the diffracted x-ray beam from a crystal. Contrast in the image results from point-to-point variation in the diffracted intensity through the crystal. An example of a diffraction image is shown in figure 1. That this image is in some way a topographic representation of the sample can be seen in the impression of differing elevations and textures in different parts of the image. However, since this image is a result of diffraction from the sample the interpretation of the image is much more complex.Diffraction contrast is usually separated into two types: mosaic contrast and extinction contrast. Mosaic contrast occurs for crystals considered to be formed from a collection of small perfect crystal blocks. These blocks have a well defined rocking curve width, the angular range over which they will diffract, and may be slightly misoriented with respect to each other and/or may have different lattice spacing.