Abstract
ABSTRACTThe use of digital electron microprobe x-ray compositional mapping with wavelength dispersive spectrometers to understand the microstructure of yttria stabilized zirconia thermal barrier coatings is described. Data from quantification of element x-ray maps can be utilized to infer what phase or phases are present. Analysis of a plasma-sprayed coating prepared from a fused and crushed feedstock is compared to an annealed specimen of the same material.
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