Microstructural Characterization of ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7-{\rm x}}$ Films With ${\rm BaZrO}_{3}$ Nanorods Grown on Vicinal ${\rm SrTiO}_{3}$ Substrates

Abstract

When grown on miscut SrTiO3 substrates, significant microstructural changes are observed in BaZrO3-doped YBa2Cu3O7-x thin films when compared to those on non-vicinal substrates. Scanning Electron Microscopy indicates a surface morphology strongly influenced by the vicinal angle, and an accumulation of BaZrO3 particles is observed near the step edges. Cross-sectional Transmission Electron Microscopy reveals that while the columnar formations of BaZrO3 rods typically seen on non-vicinal substrates are present, a significant increase in planar defects in a 10deg vicinal film are observed. The effects observed with increasing miscut angle indicate that the modulated surface provided by the vicinal substrate influences the crystalline quality of the YBCO matrix and BZO columnar formation through the thickness of the film.