Microstructural characterization of polypropene surfaces using grazing incidence X-ray diffraction

Abstract

The grazing incidence X-ray diffraction was applied for characterizing the crystalline structure of the outermost layer of polypropene sheets. Even in the outermost surface layer within about 5 nm, the crystalline structure of the a form was confirmed by the X-ray diffraction patterns. The values of a and c for the crystal lattice dimension were almost constant in spite of the variation of surface layer crystallinity, whereas the value of b for the surface layer decreased with increasing crystallinity or decreasing comonomer content of polypropene. This suggests that the density of the crystal increased as a function of crystallinity. Additionally, the value of b for the surface layer was smaller than that of the bulk. It was concluded that the lattice distortion can be ascribed to the residual stress caused by the molding pressure under the higher super-cooling rate.