Abstract
Electron Backscattered Pattern (EBSP) technique has been shown to be an effective tool for measuring lattice orientation of bulk polycrystalline materials in an SEM. Automation of this technique through Orientation Imaging Microscopy (OIM) opened a new era of materials characterization which had only existed using Transmission Electron Microscope (TEM) for thin foil specimens. Investigation of grain orientation and grain to grain misorientation are among a number of parameters which are crucial in studying the mechanisms of deformation in materials, especially superplastic materials. The microstructure and texture changes corresponding to different stages of Superplastic Forming (SPF) has been traditionally characterized using conventional optical, TEM and X-ray Techniques. TEM analysis of grain structure and subgrain formation could only provide information for individual grains or at best a small region of the microstructure, hence do not provide a global picture. On the other hand, the data obtained by OIM technique and the regeneration of the microstructure based on different definitions of grain boundary can provide a better understanding of Superplasticity.
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