Abstract
Zirconia was stabilized in thin film form by three ceramic oxides (MgO, CeO 2, Gd 2O 3). Crystallographic and microstructural feature studies were undertaken. X-ray diffraction analysis allowed the stabilization process to be followed as a function of dopant concentration in the ZrO 2 matrix. It was found that for the three systems of interest, the mole percentage of additive oxide needed to stabilize zirconia in a cubic lattice is in agreement with the equilibrium phase diagrams, i.e. more than 14 mol% for MgO, 18 mol% for CeO 2 and 10 mol% for Gd 2O 3. Based on X-ray diffraction measurements, a series of mixed films in ZrO 2MgO, ZrO 2CeO 2 and ZrO 2Gd 2O 3 produced by co-evaporation at 550 °C was studied in order to determine the effect of dopant concentration lattice parameters, average particle size and residual stress. A cubic lattice parameter in the ZrO 2MgO system was found to decrease slowly with increasing MgO mole percentage whilst it increases linearly for the ZrO 2CeO 2 and ZrO 2Gd 2O 3 systems. Particle size was found to be lower than 200 Å for the samples investigated but films were crystalline. A merely indicative stress study in stabilized samples shows tensile stresses in the ZrO 2MgO system. Residual stresses were highly compressive in the two other systems.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
