Abstract
LiCoO2 thin films were fabricated using the metal-induced crystallization (MIC) method. The effect of MIC on the microstructural and electrochemical properties of the films was investigated. The crystal structures and surface morphologies of the deposited films were investigated by X-ray diffraction (XRD), Raman spectroscopy, and field emission electron microscopy (FE-SEM). Charge-discharge tests were carried out in order to examine the electrochemical properties of the films. The LiCoO2 thin film fabricated using MIC exhibited better microstructural and electrochemical properties at a lower annealing temperature.
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