Microsecond-scale X-ray imaging with Controlled-Drift Detectors

Abstract

The Controlled-Drift Detector is a fully-depleted silicon detector that allows 2-D position sensing and energy spectroscopy of X-rays in the range 0.5–20keV with excellent time resolution (few tens of μs) and limited readout channels. In this paper we review the Controlled-Drift Detector operating principle and we present the X-ray imaging and spectroscopic capabilities of Controlled Drift Detectors in microsecond-scale experiments and the more relevant applications fields.