Abstract
The imaging properties of a Fresnel zone-plate (FZP) were used for magnified imaging of microobjects using hard X-rays. The experiments were done using 14 keV synchrotron radiation. The coherence properties of the radiation produced by an undulator allowed the recording of real images and holograms from an object in one single exposure. These images result from the positive and the negative first order diffracted beams respectively. The X-ray microscope worked at an X-ray magnification factor of 12 and could resolve structures of 0.3 μm in size. By going to slightly defocused conditions we obtained magnified images of the holographical nearfield diffraction pattern (in-line holograms) of the object.
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