Abstract
ABSTRACTAtomic force microscopy (AFM) is used to measure local electrical conductivity of HPHT nanodiamonds (NDs) dispersed on Au substrate in the as-received state and after thermal or plasma treatments. Oxygen-treated NDs are highly electrically resistive, whereas on hydrogen-treated NDs electric current around -200 pA at -2 V is detected. The as-received NDs as well as NDs after an underwater radio-frequency (RF) plasma or laser irradiation (LI) treatments contain both electrically conductive (two types: highly and weakly conductive) and highly resistive particles. The higher conductivity is attributed to H-terminated (RF) or graphitized (LI) NDs. The lower conductivity is attributed to NDs with hydrogenated amorphous carbon shell.
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