Abstract
Nowadays many different types of chips are used virtually everywhere in the real world. Sometimes, it is necessary to ensure that a certain chip meets specific requirements. For this reason, it is essential to examine various properties of chips; one of those can be, e.g., the chip security with respect to its physical structure. This paper provides description of a proven chip decapsulation process (the presented process can be used to obtain bare chips for further analysis) and some additional information concerning analysis of the chips. Finally, a prototype of our application designated for later semiautomatic analysis is also briefly presented.
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