Microscopic analysis of alpha scattering from 28Si at 40 and 45 MeV.

Abstract

Angular distributions for the elastic and inelastic alpha scattering from $^{28}\mathrm{Si}$ at ${\mathit{E}}_{\mathrm{\ensuremath{\alpha}}}$=40 and 45 MeV are analyzed in the framework of microscopic folding model. Transition densities are calculated from improved s-d shell-model wave functions and are also compared with those extracted from inelastic electron scattering data. The density-dependent Jeukenne-Lejeune-Mahaux interaction is used, besides the M3Y interaction, in an attempt to fit the large-angle data. Fairly good agreement with the data is obtained. The extracted ${\mathit{M}}_{\mathit{n}}$/${\mathit{M}}_{\mathit{p}}$ value for the ${2}^{+}$ excited state of $^{28}\mathrm{Si}$ also compares well with the shell-model prediction.