Abstract
A point spread function evaluation method for a microscope on the object plane that is perpendicular to the optical axis is proposed. The measurement of the incident beam direction from the dual position-sensitive-detector (PSD)-based units, the determination of the object plane perpendicularity and the paraxial region, and evaluation methods for the point spread function (PSF) are presented and integrated into the proposed method. The experimental verification demonstrates that the proposed method can achieve a 3D PSF on the perpendicular object plane, as well as magnification, paraxial region evaluation, and confirmation for any microscopic system.
Highlights
In microscopic imaging, the imaging of a point-like light source does not appear as a point due to a diffraction pattern termed the point spread function (PSF)
The PSF should be measured on a pre-determined object plane that is perpendicular to the optical axis of the microscopic system (Figure 1)
The focal object plane was used as the original position along the Z-axis, and it was demonstrated that the obtained PSF fitting line closely matched the original data (Figure 7)
Summary
The imaging of a point-like light source does not appear as a point due to a diffraction pattern termed the point spread function (PSF). The PSF should be measured on a pre-determined object plane that is perpendicular to the optical axis of the microscopic system (Figure 1). Realizing goal its on corresponding perpendicular object plane the focus depth This goal this becomes becomes morewith difficult with super-resolution microscopic measurements. PSF does not have a corresponding object plane that perpendicular when the PSFreduced does not havethe a corresponding object plane that is perpendicular to isthe optical axis In this case, allobject the corresponding planesmust within depth restoration. Measured object that is perpendicular to the axis of is the measured object plane thatifisthe perpendicular to theplane optical axis is not determined, theoptical meanings not PSF, determined, the meanings of region the PSF, and paraxial region will be lost for the magnification, and paraxial will magnification, be lost for super-resolution microscopic measurements.
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