Abstract

This work deals with the usage of signal noise and micro‐plasmas luminescence for solar cells diagnostic. When high electric field is applied to PN junction of solar cell with some technological imperfections it produces in tiny areas of enhanced impact ionization called micro‐plasmas which could lead to deterioration in quality or destruction of PN junction. On this account it is possible to use methods which indicate presence of micro‐plasma in junction and enable quality and quantitative description of tested cells.

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