Micromagnetic studies on measurements of crystalline anisotropy and magnetostriction in disk media

Abstract

Measurements of intrinsic magnetic parameters are important in the study of magnetic devices. A micromagnetic model is set up for a perpendicular disk media, including a recording layer (RL, CoCrPt-SiO2, 6 nm), a 12-nm nonmagnetic interlayer and an amorphous soft underlayer (a-SUL, FeCo, 42 nm), in order to study the measurement methods of the crystalline anisotropy and magnetostriction constants in the RL. The effects of the a-SUL on the magnetic properties of the RL are studied by calculating the hysteresis loops. The contributions of the RL and a-SUL to the torque curves of the whole media are calculated respectively. If the intrinsic stress at the interface between the RL and interlayer is along one of the in-plane directions, the crystalline anisotropy constant K1 and magnetostriction field Hms can be determined simultaneously from the simulated in-plane torque curves.