Abstract
Domain imaging techniques are used to analyze the micromagnetic behavior of microelements applied in spin-transport devices. Micromagnetic simulations enable direct comparison of the experimental results and give additional information which is not directly accessible experimentally. As a case study we investigate the stray-field interaction of microelements prepared on thin Si3N4 membranes with magnetic-transmission X-ray microscopy and magnetic-force microscopy. Micromagnetic simulations yield internal parameters such as local stray fields and total magnetic energy. Values for the strength of the stray-field interaction between two microelements of several milli Tesla are deduced. Results also show that pinned magnetizations can explain the magnetization patterns observed in the experiments.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
