Abstract
This paper introduces measurement of weak magnetic field using a novel design of chip-scale Spin Exchange Relaxation Free (SERF) atomic magnetometer based on a microfabricated Rubidium (Rb) vapor cell. The sensor, which integrates a micro-fabricated Rb vapor cell, a heater and related components, is fabricated by stacking printed circuit boards (PCB) and Micro Electro Mechanical Systems (MEMS) process technology. During the experiments, the noise of the measurement using the atomic magnetometer was obtained. In addition, a test of the simulated magnetic field was performed in a shielding cylinder, and the signal of the simulated magnetic field about 100 pT at 1.2 Hz was measured. The signal is processed by the software using a notch filter to suppress the Direct Current (DC) noise and 50Hz noise. This paper provides a novel micro-fabricated device for detecting weak magnetic field.
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