Microelectrodeposition: A sample purification and loading technique for thermal ionization mass spectrometry

Abstract

The isotopic analysis of nanogram quantities of high ionization potential elements by thermal ionization mass spectrometry using an ionization activator is affected by the presence of impurities which can suppress the ion beam and introduce spectral interferences. Microelectrodeposition of the sample directly on to the mass spectrometer filament prior to the addition of the silica gel-phosphoric acid activator is an effective means of purifying the sample, yet it adds minimal blank. Such procedures have been developed for nanogram samples of Pd, Ag, Cd, Te and Pb.