Abstract
Quantitative image analysis of radiation induced damage microstructure is very important in evaluating material behaviors in radiation environment. But, quite a few improvement have been seen in quantitative analysis of damage microstructure in these decades. The objective of this work is to develop new system for quantitative image analysis of damage microstucrure which could improve accuracy and efficiency of data sampling and processing and could enable to get new information about mutual relations among dislocations, precipitates, cavities, grain boundaries, etc., In this system, data sampling is done with X-Y digitizer. The cavity microstructure in dual-ion irradiated 316 SS is analyzed and the effectiveness of this system is discussed.
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