Abstract
Wavelength dispersive X-ray spectrometry (WDS) offers significant advantages over energy dispersive X-ray spectrometry for PIXE analysis in some situations. Compared with energy dispersive Si(Li) detectors, the better energy resolution of WDS results in better separation of closely spaced adjacent X-ray peaks and enhanced signal to background ratios. These can result in greater accuracy in quantitative analysis, and increased sensitivity for trace element analysis. In addition, it is possible to analyze elements from beryllium upwards ( Z ≥ 4). We have installed a commercial WDS detector on a nuclear microprobe system located at Lawrence Livermore National Laboratory. Advantages and limitations of wavelength dispersive spectrometry and considerations for calibration and operation are discussed. Representative results are presented for micro-PIXE analysis.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
