Microbeam analysis applied to adhesion, surfaces and interfaces

Abstract

Typical applications of microbeam surface analysis techniques of XPS and ToF-SIMS in adhesion research are being described. Three areas of endeavour are identified as being important in the use of surface analysis in adhesion research; the assessment of surface cleanliness prior to the adhesion process; the forensic analysis of interfacial failure surfaces; probing the interfacial chemistry of adhesion. Examples, chosen from work in the author’s laboratory, are used to illustrate the levels of information that may be attainable from both model systems and from fully formulated, commercial, systems using these techniques. It is concluded that both XPS and ToF-SIMS have important roles to play in adhesion research and for a complete picture of interfacial chemistry and subsequent failure both must be employed.