Abstract
Scanning ion microscopy (SIM) and secondary ion mass spectrometry (SIMS) are uniquely suited to the study of aluminum-lithium alloys because of the intense Li + signal that is generated when high energy ions impinge on lithium-containing materials. We used a high-lateral-resolution scanning ion microprobe to determine the Li distribution in AlLi alloys containing less than about Li. In these alloys, the 7Li + signal-to-background ratio is about 10 5. We obtained 7Li +, 27Al + and 34(AlLi) + distribution images exhibiting better than 100 nm spatial resolution that show both the distribution of Li in binary alloys and the morphology of δ (AlLi phase) plates. For the first time, SIM images of coarse (∼ 100 nm δ′ (Al 3Li) precipitates were obtained by monitoring either the 27Al +, 7Li + or the 34(AlLi) + secondary ion signals and were compared directly with TEM images. These molecular ion signals can only be detected, without artifacts, in the complete absence of oxygen adsorbed on the alloy. Calibration data were obtained which form the basis for qualtitative Li measurement.
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