Abstract
A method of determining flourine contamination on and below the surface of zircaloy by means of proton irradiation using a Van de Graaff accelerator and the detection of prompt gamma radiation from the 19 F( p, αγ) 16O reaction has been studied. Formulae for deriving depth distributions of impurities from the measured counting rate have been derived. The influence of energy straggling on the depth resolution has been studied. Both the total amount and the depth distribution have been measured on samples, which have undergone different treatments. Because of the high yield from the reaction used, a quantity of flourine less than 0.01 μg/cm 2 can be detected by this method.
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