Abstract
AbstractStructural misalignments in InSb quantum wells (QWs) caused by a micro‐twin (MT) defect have been investigated by transmission electron microscopy (TEM). Dark field (DF) TEM images with the 002 reflection of the parent region show the misalignment clearly, in spite of their low image intensity. Equations that relate the width of a MT and some dimensions regarding the misalignment are derived. These equations make it possible to deduce the dimensions by [$ \bar 1 $10]‐directional 220 DF‐TEM images which have a higher image intensity than 002 DF‐TEM images. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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