Abstract
The dispersive properties of short-range surface plasmon polaritons are investigated at the buried interfaces in vacuum/Au/fused silica and vacuum/Au/SiO2/Si multilayer systems for different gold film thicknesses of up to 50 nm using two-photon photoemission electron microscopy. The experimental data agrees excellently with results of transfer matrix method simulations, emphasizing the sensitivity of the plasmonic wave vector to the thickness of the gold film and an ultrathin native substrate oxide layer. The results furthermore illustrate the exceptional qualification of low-energy electron photoemission techniques in studying electronic excitations at buried interfaces.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
