Micro PIXE and micro SXRF: comparison of the two methods and application to glass inclusions from Vulcano (Eolian Islands — Italy)

Abstract

PIXE with a 2.5 MeV proton beam of 10 × 10 μm 2 beam size and Synchrotron Radiation Induced X-ray Emission (SXRF) with photons of 11.8 keV energy and a focal spot of 5 × 2.5 μm 2 with especially high intensity of 2 × 10 9 photons/s have been performed on synthetic and natural volcanic glasses. A comparison of the possibilities and performances of these microanalytical methods is made. MDLs are given from the acquisitions obtained on synthetic glasses. Micro PIXE and micro SXRF were jointly applied to the study of trace elements in glass inclusions from the active volcanological system of Vulcano (Eolian Islands — Italy).