Abstract
The magnetic force microscopy technique has been utilized to study domain configurations in FeMn exchange biased NiFe film patterned into micrometer scale rectangular elements at elevated temperatures. MFM images clearly show the formation process of the multidomain configuration as the exchange bias field weakens at elevated temperatures. It is concluded that the reduction of exchange bias field is not spatially uniform at the micrometer scale. Formation of cross-tie structures along domain walls seems to be favored at elevated temperatures.
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