MFM Domain Imaging of Textured Ni-Mn-Ga/MgO(100) Thin Films

Abstract

Magnetic, micromagnetic, and texture properties of the martensitic thin films prepared by magnetron sputtering of Ni49.5Mn28Ga22.5 target on MgO(100) wafer are studied as a function of film thickness. The films exhibit 220-fiber texture. Moreover, in contrast to thick films, a considerable in-plane texture component is giving rise to the pronounced in-plane magnetic anisotropy found in the thin film. The texture features together with a large magnetocrystalline anisotropy lead to the particular domain structure and different magnetic anisotropy components of films depending on the film thickness and substrate nature.