Meyer–Neldel rule in fullerene field-effect transistors

Abstract

The temperature dependence of the field-effect mobility is investigated in vacuum evaporated C60-based organic field-effect transistors. The results show a thermally activated behavior with an activation energy that depends on the field-induced charge carrier density in the transistor channel. Upon extrapolation of the data in an Arrhenius plot we find an empirical relation, termed the Meyer–Neldel rule, which states that the mobility prefactor increases exponentially with the activation energy. Based on this analysis a characteristic temperature is extracted. The possible implications of this observation in terms of charge transport in fullerene-based field-effect transistors are discussed.