MeV-atomic-ion-induced surface tracks in Langmuir-Blodgett films and l-valine crystals studied by scanning force microscopy

Abstract

To acquire new information about the electronic sputtering of organic samples, we have obtained tapping mode scanning force microscopy images of craters induced by individual surface-grazing 48.6 MeV 79Br ions incident on Langmuir-Blodgett (LB) and l-valine surfaces. Crater sizes depended somewhat on the parameters of the tapping mode. For LB films, crater widths were 24–34 nm, while depths ranged from 5 to 8 nm. For l-valine crystals, crater widths ranged from 33 to 39 nm, and depths ranged from 4–7 nm. We discuss the observations in the framework of pressure pulse and evaporative thermal spike sputtering models.