Abstract
Point defect creation in 8.7 MeV C 5-cluster irradiated LiF crystals have been studied in a dose range from 2 × 10 10 up to 1 × 10 13 C 5 +/cm 2 and compared to the defect creation in similar conditions with single energetic carbon ions. An enhancement of the primary defect creation (F-centres) and aggregation (F 2-centres) has been measured in a near surface region as deep as about 0.3 μm corresponding to an energy per carbon atom of the incident cluster decreasing from 1.74 MeV at the impact down to 1.3 MeV. In this region, the carbon atoms of a cluster are confined in a track with a radius (∼ 100 nm) comparable to that of a single carbon ion track. This leads to a very high locally deposited energy density which is directly responsible of the enhanced defect production measured.
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