Abstract
AbstractThe implementation of Cyber-Physical Systems (CPS) applied across the manufacturing value chain helps to make processes more efficient since CPS enable the creation of more personalized, diversified and mass-produced products. This paper addresses the challenges of integrating Dimensional Measurement Equipments in a CPS manufacturing system, often addressed as Cyber-Physical Production Systems (CPPS). CPS and Industry 4.0 represent an opportunity for metrology. The challenge is to design a CPPS, considering the metrology information required to provide value-added services to the manufacturing system. The use of open information models and established standards will be addressed to enable data to flow seamlessly from the physical layer (measuring devices) to the cyber layer of a CPPS, mainly focusing on the Quality Information Framework (QIF) information model.KeywordsCyber-Physical Production SystemsOpen information modelsMetrologyIntegrationSmart manufacturing
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
