Metrology for information technology

Abstract

Abstract : In May 1996, NIST management requested a white paper on metrology for information technology (IT). A task group was formed to develop this white paper with representatives from the Manufacturing Engineering Laboratory (MEL), the Information Technology Laboratory (ITL), and Technology Services (TS). The task group members had a wide spectrum of experiences and perspectives on testing and measuring physical and IT quantities. The task group believed that its collective experience and knowledge were probably sufficient to investigate the underlying question of the nature of IT metrology. During the course of its work, the task group did not find any previous work addressing the overall subject of metrology for IT. The task group found it to be both exciting and challenging to possibly be first in what should be a continuing area of study. After some spirited deliberations, the task group was able to reach consensus on its white paper. Also, as a result of its deliberations, the task group decided that this white paper should suggest possible answers rather than assert definitive conclusions. In this spirit, the white paper suggests: a scope and a conceptual basis for IT metrology; a taxonomy for IT methods of testing; status of IT testing and measurement; opportunities to advance IT metrology; overall roles for NIST; and recapitulates the importance of IT metrology to the U.S. The task group is very appreciative of having had the opportunity to produce this white paper. The task group hopes that this white paper will provide food for thought for our intended audience: NIST management and technical staff and our colleagues elsewhere who are involved in various aspects of testing and measuring IT.