Abstract
Two distance measures for attributed graphs are presented that are based on the maximal similarity common subgraph of two graphs. They are generalizations of two existing distance measures based on the maximal common subgraph. The new measures are superior to the well-known measures based on elementary edit transformations in that no particular edit operations (together with their costs) need to be defined. Moreover, they can deal not only with structural distortions, but also with perturbations of attributes. It is shown that the new distance measures are metrics.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: International Journal of Pattern Recognition and Artificial Intelligence
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.