Methods of selecting common bean lines having high yield, early cycle and erect growth

Abstract

Selection for grain yield, combined with phenological and morphological characteristics of agricultural interest, represents technological advances in the common bean. The objectives of this work were to estimate genetic parameters and the efficiency of both the Pedigree and Single-Seed Descent (SSD) methods for progression segregating populations in order to obtain common bean lines superior in grain yield, precocity and plant architecture. To do this, 136 inbred lines obtained using the Pedigree method, and 136 inbred lines obtained by SSD method were evaluated in a 17 x 17 simple lattice design, integrating the 272 inbred lines in the F 7 generation and 17 cultivars as control. Estimates of moderate narrow sense heritability were obtained for grain yield, lodging and insertion of the first pod. The cycle and general adaptation note showed low heritability for the F 7 generation. The Pedigree method allows obtaining a greater number of lines of high grain yield, early cycle and a lower general adaptation note (best adaptability). Selection using the Single-Seed Descent method allows the identification of a larger number of lines with lower notes for lodging and higher insertion of the first pod.