Abstract
Two techniques for the preparation of cross-sectional scanning electron microscopy specimens are described. The method that utilizes a tapered cross section is emphasized. This method was developed for the examination of the oxide-metal interface in zirconium alloy corrosion specimens. Typical micrographs are presented for the oxide-metal interface in Zr-2.5wt.% Nb alloy corrosion specimens and for the TiN-substrate interface for TiN coated stainless steel.
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