Abstract
Energy yield (EY) modelling is an indispensable tool to minimize payback time of emerging perovskite-based multi-junction photovoltaics (PV) but it relies on many assumptions about device architecture and environmental conditions. Here, we propose a comprehensive framework that enables rapid simulation of complex architectures of perovskite-based multi-junction PV and detailed calculation of their power output under realistic irradiation conditions in various climatic zones. Applying the framework to perovskite/silicon multi-junction solar modules, we showcase the impact of tracking on energy losses arising from spectral variations. Moreover, we demonstrate the strong dependency of the EY of bifacial multi-junction solar modules on the albedo.
Highlights
In order to lower the levelized cost of electricity (LCoE) of photovoltaics (PV) substantially [1], the power output of PV modules needs to increase further
In particular for multi-junction PV, the absorber thicknesses can differ significantly by up to 30% when optimizing the architecture for annual energy yield (EY) rather than power conversion efficiencies (PCE) under standard test conditions (STC) [21, 22]
We present the methodology of EY modelling for PV with a strong focus on perovskite-based multi-junction solar modules
Summary
In order to lower the levelized cost of electricity (LCoE) of photovoltaics (PV) substantially [1], the power output of PV modules needs to increase further In this regard, perovskite-based tandem PV is currently the focus of attention by researchers and industries world-wide, since the technology promises power conversion efficiencies (PCE) vastly exceeding the limits of the market-dominating single-junction silicon (Si) PV [2]. The proposed methodology of EY modelling is based on four independent modules (see Fig. 1) providing realistic spectral irradiation covering a broad range of locations in the USA and the optical and electrical response of multi-junction solar modules This modular EY framework can identify trends for specific architectures via the analysis of light-trapping concepts or the evaluation of the electric interconnection schemes, providing design rules for device properties (e.g. layer thicknesses) or optimal tilt for various locations. The EY is computed by combining the spectral and angular resolved solar irradiation (with or without albedo), the absorptance of the multi-junction solar module and the electrical properties (see Fig. 2)
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